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Volumn 68, Issue 1, 2004, Pages 177-189

Characterization of ammonioleucite (NH4 [AlSi2O6] and ND4-ammonioleucite (ND4[AlSi2O6] using IR spectroscopy and Rietveld refinement of XRD spectra

Author keywords

Ammonioleucite; IR spectroscopy; Rietveld refinement; XRD

Indexed keywords

AMMONIUM COMPOUNDS; CRYSTAL GROWTH; INFRARED SPECTROSCOPY; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS;

EID: 0442308881     PISSN: 0026461X     EISSN: None     Source Type: Journal    
DOI: 10.1180/0026461046810179     Document Type: Article
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.