Atomic force microscopy of synthetic imogolite

Geoderma

Volumn 118, Issue 3-4, 2004, Pages 209-220

  Tani, M ^a,b   Liu, C ^a,c   Huang, P M ^a  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

^b OBIHIRO UNIVERSITY OF AGRICULTURE AND VETERINARY MEDICINE   (Japan)

^c Kuo Testing Labs Inc   (United States)

Author keywords

Atomic force microscopy; Contact mode and tapping mode; Imogolite; Surface features; Thread diameter

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMOGOLITE; MORPHOLOGY;

EID: 0442298858     PISSN: 00167061     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0016-7061(03)00204-0     Document Type: Article

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