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Volumn 19, Issue 6, 2003, Pages 1027-1033

Distributed performance evaluation of a controlled IC fab

Author keywords

Dispatching system; Distributed colored timed Petri net (DCTPN); Integrated circuit (IC) foundry fab; Manufacturing execution system (MES); Performance evaluation; Semiconductor manufacturing

Indexed keywords

DISTRIBUTED PARAMETER CONTROL SYSTEMS; INTEGRATED CIRCUIT MANUFACTURE; MATHEMATICAL MODELS; PETRI NETS; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0442295568     PISSN: 1042296X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TRA.2003.819720     Document Type: Article
Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.