Topographical and Electrochemical Characterization of Optically Smooth Zn Films Prepared by Physical Vapor Deposition

Journal of the Electrochemical Society

Volumn 148, Issue 7, 2001, Pages

  Luo, Yu ^a,b   Yee, Nelson ^a   Shi, Qingfang ^a   Zhang, Baoxin ^a   Mo, Yibo ^a,b   Chottiner, Gary S ^a   Scherson, Daniel A ^a,b  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

^b ELECTROCHEMICAL SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0442282028     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1376120     Document Type: Article

References (4)

1. X. G. Zhang, Corrosion and Electrochemistry of Zinc, Plenum Press, New York, (1996).
2. H. Levinstein, J. Appl. Phys., 20, 306 (1949).
3. S. Salém-Vasconcelos and O. Dietzsch, Nucl. Instrum. Methods Phys. Res. A, 379, 221 (1996).
4. R. G. Picard and O. S. Duffendack, J. Appl. Phys., 14, 291 (1943).