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A recent study by dynamic SIMS showed depth-profiling data on fluorinated epoxy films, where the dependence of the thickness (up to 25 nm) of fluorine-rich layer on the total fluorine content was clearly demonstrated. van Gennip, W. J. H. The Analysis of Polymer Interfaces: A Combined Approach. Ph.D. dissertation, Eindhoven University of Technology, 2003 Chapter 3.
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