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Volumn 45, Issue 6, 2002, Pages 853-857

Measurements of Thermal Kinetic Characteristics of Film Structures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0442263378     PISSN: 00204412     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1021464029534     Document Type: Article
Times cited : (2)

References (9)
  • 6
    • 0442263904 scopus 로고    scopus 로고
    • Web: www.gage-applied.com.
  • 7
    • 0026860430 scopus 로고
    • Brovchenko, V.G., Prib. Tekh. Eksp., 1992, no. 3, p. 124; Danilov, A.A., Prib. Tekh. Eksp., 1987, no. 2, p. 63.
    • (1992) Prib. Tekh. Eksp. , Issue.3 , pp. 124
    • Brovchenko, V.G.1
  • 8
    • 0026860430 scopus 로고
    • Brovchenko, V.G., Prib. Tekh. Eksp., 1992, no. 3, p. 124; Danilov, A.A., Prib. Tekh. Eksp., 1987, no. 2, p. 63.
    • (1987) Prib. Tekh. Eksp. , Issue.2 , pp. 63
    • Danilov, A.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.