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Volumn 80, Issue 4, 1996, Pages 2521-2523
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Noncontact thickness and composition assessment of a strained AIGaAs/AIAs/InGaAs double barrier multiple quantum well structure
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0348249633
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.363036 Document Type: Article |
Times cited : (4)
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References (13)
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