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Volumn 58, Issue 6, 2004, Pages 1117-1120
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Size effect of nano-copper films on complex optical constant and permittivity in infrared region
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Author keywords
Complex optical constant; Complex permittivity; Magnetron sputtering; Nano copper film; Size effect
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Indexed keywords
CAPACITANCE;
CORRELATION METHODS;
DEPOSITION;
FILM GROWTH;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
INFRARED RADIATION;
LIGHT REFLECTION;
LIGHT TRANSMISSION;
MAGNETRON SPUTTERING;
MICROSTRUCTURE;
NANOSTRUCTURED MATERIALS;
PARAMETER ESTIMATION;
PERMITTIVITY;
THICKNESS MEASUREMENT;
COMPLEX OPTICAL CONSTANT;
COMPLEX PERMITTIVITY;
NANO-COPPER FILMS;
SIZE EFFECT;
METALLIC FILMS;
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EID: 0348231751
PISSN: 0167577X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matlet.2003.09.002 Document Type: Article |
Times cited : (14)
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References (19)
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