Substrate and oxygen-annealing effects on the pulsed-laser-deposited La0.5Ca0.5Mn1-xMxO3 (M = Fe, Ni) thin films

Journal of Optoelectronics and Advanced Materials

Volumn 5, Issue 2, 2003, Pages 409-414

  Hsu, L S ^a   Liu, C J ^a   Wu, T W ^a   Luca, D ^a,b  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^b ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

Author keywords

Magnetoresistance; Perovskite; Pulsed laser deposition; X ray absorption spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; ANNEALING; ELECTRONIC PROPERTIES; EPITAXIAL GROWTH; MAGNETORESISTANCE; OXYGEN; PEROVSKITE; PULSED LASER DEPOSITION; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTOR DOPING; SINGLE CRYSTALS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

EPITAXIAL LAYERS; X-RAY ABSORPTION SPECTROSCOPY;

LANTHANUM COMPOUNDS;

EID: 0348224803     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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