|
Volumn 207-209, Issue PART 1, 1996, Pages 221-224
|
A candidate for grain boundary pipe diffusion and intrinsic electrical activity in silicon
|
Author keywords
Boundary; Conditions; Grain Boundary; Molecular Dynamics; Numerical Simulations; Silicon; Tight Binding
|
Indexed keywords
BOUNDARY CONDITIONS;
COMPUTER SIMULATION;
CRYSTALS;
ELECTRON MICROSCOPY;
HIGH TEMPERATURE PROPERTIES;
MOLECULAR DYNAMICS;
MONTE CARLO METHODS;
SILICON;
THERMODYNAMICS;
ELECTRONIC STATES;
GRAIN BOUNDARY PIPE DIFFUSION;
INTRINSIC ELECTRIC ACTIVITY;
MOBIUS IMAGE;
GRAIN BOUNDARIES;
|
EID: 0348210160
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.207-209.221 Document Type: Article |
Times cited : (14)
|
References (7)
|