Cavity Techniques for Substrate Properties at Microwave/Millimeter-wave Bands

Microwave Journal

Volumn 46, Issue 12, 2003, Pages 112-124

  Damaskos, Nickander J ^a   Kelsall, Benuel J ^a  

^a Damaskos Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MILLIMETER-WAVE BANDS; THIN SHEET TESTERS;

ANISOTROPY; MICROSTRIP DEVICES; PARAMETER ESTIMATION; PERMITTIVITY; QUALITY CONTROL; SUBSTRATES;

MILLIMETER WAVE DEVICES;

EID: 0348196711     PISSN: 01926225     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (5)

1. W.E. Courtney, "Analysis and Evaluation of a Method of Measuring the Complex Permitivity and Permeability of Microwave Insulators," IEEE MTT Transactions, Vol. 18, No. 8. August 1970, pp. 476-485.
2. "IPC-TM-650 Test Methods Manual," Institute for Interconnecting and Packaging Electronic Circuits, Lincolnwood, IL.
3. "ASTM 2520, Standard Test Methods for Complex Permittivity of Solid Electrical Insulating Materials at Microwave Frequencies and Temperature," American Society for Testing and Materials, West Conshohocken, PA.
4. D.W. Pozar, Microwave Engineering, Addison Wesley, 1990.
5. "Damaskos Inc. Material Measurement Systems - 2003 Catalog," Damaskos Inc., Chadds Ford, PA.