Analysis of Admittance Data: Comparison of a Parametric and a Nonparametric Method

Journal of Computational Physics

Volumn 153, Issue 1, 1999, Pages 139-159

  Winterhalter, J ^a   Ebling, D G ^a   Maier, D ^a   Honerkamp, J ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

Author keywords

Admittance spectroscopy; Ill posed problem; Non parametric method; Parametric method; Tikhonov regularization

Indexed keywords

GALLIUM ARSENIDE; III-V SEMICONDUCTORS; MONTE CARLO METHODS; RELAXATION TIME; SCHOTTKY BARRIER DIODES;

ADMITTANCE SPECTROSCOPIES; CHARACTERISTICS PARAMETERS; DATA COMPARISONS; DEEP-LEVELS; DISCRETE CONTRIBUTIONS; ILL POSED PROBLEM; NONPARAMETRIC METHODS; PARAMETRIC METHOD; THERMAL RELAXATION TIME; TIKHONOV REGULARIZATION;

INVERSE PROBLEMS;

EID: 0348194852     PISSN: 00219991     EISSN: None     Source Type: Journal    
DOI: 10.1006/jcph.1999.6269     Document Type: Article

References (13)

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