Experimental and analytical properties of 0.2-μm-wide, end-on, multilayer, giant magnetoresistance, read head sensors

Journal of Applied Physics

Volumn 79, Issue 8 PART 2B, 1996, Pages 5889-5891

  Pohm, A V ^a   Beech, R S ^a   Daughton, J M ^a   Chen, E Y ^b   Durlam, M ^b   Nordquist, K ^b   Zhu, T ^b   Tehrani, S ^b  

^a NVE CORPORATION   (United States)

^b MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0348194070     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362163     Document Type: Article

References (4)

1. E. Y. Chen, A. V. Pohm, J. M. Daughton, J. Brown, and W. Black, IEEE Trans. Magn. 30, 3816 (1994).
2. H. Fujiwara and M. R. Parker, J. Magn. Magn. Mater. 135, L23-L9, (1994).
3. H. Y. Yoo, A. V. Pohm, J. H. Hur, S. W. Kenkare, and C. S. Comstock, IEEE Trans. Magn. 25, 4269 (1989).
4. T. Shibata, N. Saito, H. Narisawa, Y. Sada, and T. Sekiya, IEEE Trans. Magn. 30, 3843 (1994).