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Journal of Applied Physics

Volumn 72, Issue 6, 1992, Pages 2294-2298

Effect of near-contact regions on the interpretation of ohmic behavior in trap-dominated relaxation semiconductors

(3) Derhacobian, N a Madok, J H a Haegel, N M a

a UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0348117747 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.351571 Document Type: Article

Times cited : (9)

References (11)

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- Popescu, C.¹ Henisch, H.K.²

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- van Roosbroeck, W.¹ Casey, H.C.²

9
- 0010212102
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- Derhacobian, N.¹ Haegel, N.M.²

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- 0026187334
- (1991) Appl. Phys. A , vol.53 , pp. 1
- Haegel, N.M.¹

11
- 0022129188
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- Henisch, H.K.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.