Electromigration failure in thin film conductors a perspective

European Solid-State Device Research Conference

Volumn , Issue , 1996, Pages 839-846

  Lloyd, J R ^a  

^a Lloyd and Thompson Associates Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0348101536     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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