Crystal structure of a-oxobenzeneacetatotris(triphenylphosphine)silver(I), [(C8H5O3)(C18H15P)3Ag]

Zeitschrift fur Kristallographie - New Crystal Structures

Volumn 212, Issue 1, 1997, Pages 279-281

  Ng, Seik Weng ^a  

^a UNIVERSITY OF MALAYA   (Malaysia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0348091948     PISSN: 14337266     EISSN: None     Source Type: Journal    
DOI: 10.1524/ncrs.1997.212.1.279     Document Type: Article

References (12)

1. Blues, E. T.; Drew, M. G. B.; Ferai-Onadeko, B.: Tetrakis[acetatotriphenylphosphinesilver(I)]. Acta Crystallogr. B33 (1977) 3965-3967.
2. 2O. Z. Kristallogr. 210 (1995) 674-675.
3. Cassel, A.: Chlorotris(triphenylphosphine)silver. Acta Crystallogr. B37 (1981) 229-231.
4. 3X Series. Crystal and Molecular Structure of Tris(triphenylphosphine)sUver(I)tetrafluoroborate and Tris(triphenylphosphine) silver(I)iodide. Inorg. Chim. Acta 127 (1987) 209-213.
5. 3(n= 1-4). J.Chem.Soc.DaltonTrans.(1986) 1965-1970.
6. Tiekink, E. R. T.: X-ray Structures of Bis[(2-aminophenyl)diphenylphosphine] bis(ethanol)silver(I) Nitrate and Tris(2-aminophenyl)diphenylphosphine] silver(I) Nitrate Monohydrate. J. Coord. Chem. 28 (1993) 223-230.
7. Altomare, A.; Cascarano, G.; Giacovazzo, C.; Guagliardi, A.; Burla, M. C.; Polidori, G.; Camalli, M.: SIR92-A Program for the Automatic Solution of Crystal Structures by Direct Methods. J. Appi. Crystallogr. 27 (1994)435.
8. Enraf-Nonius Delft: CAD-4 VAX/PC Fortran System. Operator's Guide to the Enraf-Nonius CAD4 Diffractometer Hardware, its Software and the Operating System. Enraf-Nonius Delft, Scientific Instruments Division, PO Box 483,2600 AL Delfi, The Netherlands 1988.
9. Gabe, E J.; Le Page, Y.; Charland, J.-P.; Lee, F. L.; White, P. S.: NRCVAX-An Interactive Program System for Structure Analysis. J. Appi. Crystallogr. 22(1989)384-387.
10. North, A. C. T.; Phillips, D. C.; Mathews, F. S.: A Semi-Empirical Method of Absorption Correction. Acta Crystallogr. A24 (1968) 351-359.
11. Sheldrick, G. M.: SHELXTL/PC. Structure Determination Software Programs. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA 1990.
12. Sheldrick, G. M.: SHELXL-93. Program for Crystal Structure Refinement. University of Gottingen, Germany 1993.