Application of a novel multiple scattering approach to photoelectron diffraction and Auger electron diffraction

Journal of Electron Spectroscopy and Related Phenomena

Volumn 57, Issue 3-4, 1991, Pages 223-278

  Kaduwela, A P ^a   Friedman, D J ^a   Fadley, C S ^a  

^a UNIVERSITY OF HAWAII   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0348079298     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/0368-2048(91)80013-K     Document Type: Article

References (58)

1. Photoelectron diffraction
2. Summary Abstract: Off-normal and azimuthal photoelectron diffraction studies of the system C(2×2)S–Ni(001) by the multiple-scattering method
3. An assessment of multiple-scattering effects in Auger-electron diffraction and photoelectron diffraction
4. Auger electron spectroscopy - a local probe for solid surfaces
5. Angle-resolved x-ray photoemission and Auger emission from core levels of c(2×2) S and Se on Ni(001): Diffraction effects and single-scattering theory
6. Approximations for the Scattering of Excited Electrons in Solids
7. Approximations for photoelectron scattering
8. Adsorbate core-level azimuthal photoelectron diffraction at intermediate energies of 230-900 eV: Grazing emission with polarization dependence
9. Diffraction effects in angle-resolved photoemission spectroscopy
10. Determination of epitaxial overlayer structures from high-energy electron scattering and diffraction
11. Relative importance of recent improvements in the modelling of substrate X-ray photoelectron diffraction - Ni 2p3/2 emission from Ni(001)