Distance Measurement by Circular Scanning of the Excitation Beam in the Two-Photon Microscope

Microscopy Research and Technique

Volumn 63, Issue 1, 2004, Pages 34-49

  Kis Petikova, Katarina ^a   Gratton, Enrico ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

Colocalization; Fluorescence microscopy; Optical ruler; Tracking

Indexed keywords

DISTANCE MEASUREMENT; FAST FOURIER TRANSFORMS; FLUORESCENCE; OPTICAL TRANSFER FUNCTION; PHOTONS;

CIRCULAR SCANNING; COLOCALIZATION; EXCITATION BEAMS; FLUORESCENT PARTICLE; OPTICAL RULER; OPTICAL-; RELATIVE DISTANCES; TRACKING; TWO CHANNEL; TWO PHOTON;

FLUORESCENCE MICROSCOPY;

SILICON DIOXIDE;

ARTICLE; CALCULATION; CIRCULAR SCANNING; COLOR; DISTANCE MEASUREMENT; EXCITATION; FLUORESCENCE MICROSCOPY; FOURIER TRANSFORMATION; MEASUREMENT; MICROSCOPE; MODEL; MONITORING; OPTICAL INSTRUMENTATION; OPTICAL RESOLUTION; OPTICAL RULER; PRIORITY JOURNAL; TECHNIQUE; TRACKING; TWO PHOTON MICROSCOPE;

EID: 0348012915     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/jemt.10417     Document Type: Article

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