High-pressure X-ray studies of Zn at room and low temperatures with a He-pressure medium

High Pressure Research

Volumn 22, Issue 2, 2002, Pages 337-341

  Takemura, K ^a   Yamawaki, H ^b   Fujihisa, H ^b   Kikegawa, T ^c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

Diamond anvil cell; Electronic topological transition; Low temperature; Powder X ray diffraction; Zinc

Indexed keywords

CHROMATOGRAPHIC ANALYSIS; DIAMONDS; HELIUM; HIGH PRESSURE EFFECTS; HYDROSTATIC PRESSURE; LOW TEMPERATURE EFFECTS; PHASE TRANSITIONS; X RAY DIFFRACTION ANALYSIS;

DIAMOND-ANVIL CELL; ELECTRONIC TOPOLOGICAL TRANSITION; LOW TEMPERATURE; POWDER X-RAY DIFFRACTION;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 0348002006     PISSN: 08957959     EISSN: None     Source Type: Journal    
DOI: 10.1080/08957950212816     Document Type: Article

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