PASTEL: A parameterized memory characterization system

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 1998, Pages 15-20

  Ogawa, Kimihiro ^a   Kohno, Michinari ^a   Kitamura, Fusako ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT REDUCTION; DELAY ERRORS; INPUT VECTOR; PARAMETERIZED; WAVEFORM MEASUREMENT;

AUTOMATION;

EID: 0347900671     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.1998.655831     Document Type: Conference Paper

References (6)

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3. W.H.Kao, R.Hamazaki and H.Kikuchi, A Modeling and Circuit Reduction Methodology for Circuit Simulation of DRAM Circuits. IEEE International Workshop on Memory Technol-ogy, Design and Testing, pp15-20, Aug. 1995
4. C.X.Huang, B.Zhang, A.Deng and B.Swirski, The Design and Implementation of PowerMill, pp105-109, ISLPD, 1995
5. K.S.Kundert, The Designer Guide to Spice &Spectre, Kluwer Academic Publishers, 1995
6. Sente,Inc. Sente2.2 Library Development Guide, Dec.2, 1996