Tests for multiple upper or lower outliers in an exponential sample

Journal of Applied Statistics

Volumn 25, Issue 2, 1998, Pages 245-255

  Zhang, Jin ^a,b  

^a YUNNAN UNIVERSITY   (China)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347874470     PISSN: 02664763     EISSN: None     Source Type: Journal    
DOI: 10.1080/02664769823232     Document Type: Article

References (5)

1. BARNETT, V. & LEWIS, T. (1994) Outliers in Statistical Data, 3rd Edn (Chichester, Wiley).
2. CHIKKAGOUDAR, M. S. & KUNCHUR, S. M. (1983) Distributions of test statistics for multiple outliers in exponential samples, Communications in Statistics, Part A - Theory and Methods, 12, pp. 2127-2142.
3. FISHER, R. A. (1929) Tests of significance in harmonic analysis, Proceedings of the Royal Statistical Society, Series A, 125, pp. 54-59.
4. KIMBER, A. C. & STEVENS, H. J. (1981) The null distribution of a test for two upper outliers in an exponential sample, Applied Statistics, 30, pp. 153-157.
5. LEWIS, T. & FIELLER, N. R. J. (1979) A recursive algorithm for null distributions for outliers: I. Gamma sample, Technometrics, 21, pp. 371-376.