Characterization of the photoelectric effect on K + -implanted W samples

Applied Surface Science

Volumn 138-139, Issue 1-4, 1999, Pages 517-521

  Vouagner, D ^a   Beleznai, Cs ^a,b   Girardeau Montaut, J P ^a  

^a UNIVERSITÉ LYON 1   (France)

^b UNIVERSITY OF SZEGED   (Hungary)

Author keywords

Implantation; Photoyield; Surface oxidation; UV laser

Indexed keywords

EID: 0347811929     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00492-9     Document Type: Article

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