Physical model for the evaluation of solid-liquid interfacial tension in silicon

Journal of Applied Physics

Volumn 90, Issue 2, 2001, Pages 750-755

  Ujihara, Toru ^a   Sazaki, Gen ^a   Fujiwara, Kozo ^a   Usami, Noritaka ^a   Nakajima, Kazuo ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347785127     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1379349     Document Type: Article

References (22)

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