메뉴 건너뛰기




Volumn 78, Issue 20, 2001, Pages 3044-3046

Linear growth of thin films under the influence of stress

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0347768477     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1372209     Document Type: Article
Times cited : (7)

References (19)
  • 1
    • 0141621030 scopus 로고    scopus 로고
    • Characterization of Amorphous and Crystalline Rough Surfaces - Principles and Applications
    • Academic, New York
    • Y. P. Zhao, G.-C. Wang, and T.-M. Lu, Characterization of Amorphous and Crystalline Rough Surfaces - Principles and Applications, Experimental Methods in Physical Science, Vol. 37 (Academic, New York, 2000).
    • (2000) Experimental Methods in Physical Science , vol.37
    • Zhao, Y.P.1    Wang, G.-C.2    Lu, T.-M.3
  • 10
    • 0024611337 scopus 로고
    • D. J. Srolovitz, Acta Matter 37, 621 (1989); L. E. Shilkrot, D. J. Srolovitz, and J. Tersoff, Appl. Phys. Lett. 77, 304 (2000).
    • (1989) Acta Matter , vol.37 , pp. 621
    • Srolovitz, D.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.