Capability in Rockwell C Scale Hardness

Journal of Research of the National Institute of Standards and Technology

Volumn 105, Issue 4, 2000, Pages 511-532

  Liggett, Walter S ^a   Low, Samuel R ^a   Pitchure, David J ^a   Song, John ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Calibration; Critical to product quality; Experimental design; Indentation hardness; Measurement system comparison; Spatial statistics; Standard reference material; Surface measurement; Test method; Trend elimination; Uncertainty component

Indexed keywords

EID: 0347748109     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.105.041     Document Type: Article

References (10)

1. ASTM E 18-97a, Standard Test Methods for Rockwell Hardness and Rockwell Superficial Hardness of Metallic Materials, American Society for Testing and Materials, West Conshohocken, PA (1998).
2. ISO 6508-1986, Metallic Materials - Hardness Test - Rockwell Test (scales A-B-C-D-E-F-G-H-K), International Organization for Standardization (ISO), Geneva, Switzerland (1986).
3. V. Czitrom and P. D. Spagon, Statistical Case Studies for Industrial Process Improvement, Society for Industrial and Applied Mathematics, Philadelphia, PA (1997).
4. International Organization for Standardization (ISO), Guide to the Expression of Uncertainty in Measurement, Geneva, Switzerland (1993) (corrected and reprinted 1995).
5. National Institute of Standards and Technology, Standard Reference Material Certificates for Rockwell C Scale Hardness, SRM 2810 (Low Range), SRM 2811 (Mid Range), and SRM 2812 (High Range).
6. S. R. Low, R. J. Gettings, W. S. Liggett, and J. Song, Rockwell hardness - A method-dependent standard reference material, Proceedings of the 1999 NCSL Workshop and Symposium, National Conference of Standards Laboratories, Boulder, CO, 1999, pp. 565-589.
7. V. E. Lysaght, Indentation Hardness Testing, Reinhold Publishing Corporation, New York, NY (1949).
8. R. D. Cook and S. Weisberg, Applied Regression Including Computing and Graphics, John Wiley and Sons, New York, NY (1999).
9. N. A. C. Cressie, Statistics for Spatial Data, John Wiley and Sons, New York, NY (1991).
10. F. C. Curriero and S. Lele, A composite likelihood approach to semivariogram estimation, J. Agri. Biol. Environ. Stat. 4, 9-28 (1999).