Frequency and Temperature Scaling in the Conductivity and Its Structural Consequences

Physica Status Solidi (B) Basic Research

Volumn 205, Issue 1, 1998, Pages 103-109

  Brom, H B ^a   Reedijk, J A ^a   Martens, H C F ^a   Adriaanse, L J ^a   De Jongh, L J ^a   Michels, M A J ^b,c  

^a LEIDEN UNIVERSITY   (Netherlands)

^b SHELL RESEARCH AND TECHNOLOGY CENTRE   (Netherlands)

^c EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347721745     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3951(199801)205:1<103::AID-PSSB103>3.0.CO;2-R     Document Type: Article

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