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Volumn 27, Issue 10, 1998, Pages 2515-2533

A generalized negative binomial and applications

Author keywords

Discrete time queues; Quality control; Serial dependence

Indexed keywords


EID: 0347666769     PISSN: 03610926     EISSN: None     Source Type: Journal    
DOI: 10.1080/03610929808832240     Document Type: Article
Times cited : (9)

References (21)
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  • 2
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  • 3
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    • Detecting a shift in fraction nonconforming using run-length control charts with 100% inspection
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    • Bourke, P.D.1
  • 6
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    • A control chart for very high yield processes
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    • Goh, T.N.1
  • 11
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    • Probability limits on outgoing quality for continuous sampling plans
    • McShane, L.M. and Turnbull, B.W. (1991). "Probability limits on outgoing quality for continuous sampling plans," Technometrics, 33(4), 393-404.
    • (1991) Technometrics , vol.33 , Issue.4 , pp. 393-404
    • McShane, L.M.1    Turnbull, B.W.2
  • 12
    • 0028468202 scopus 로고
    • A control chart for parts-per-million nonconforming items
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    • Nelson, L.S.1
  • 13
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    • Geometric Q charts for high quality processes
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    • Quesenberry, C.P.1
  • 14
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    • Continuous sampling plans for Markov-dependent production process
    • Sampath Kumar, V.S. and Rajarshi, M.B. (1987). "Continuous sampling plans for Markov-dependent production process," Naval Research Logistics, 34, 629-644.
    • (1987) Naval Research Logistics , vol.34 , pp. 629-644
    • Sampath Kumar, V.S.1    Rajarshi, M.B.2
  • 16
    • 0030190295 scopus 로고    scopus 로고
    • Monitoring serially-dependent process with attributes data
    • Stimson, W.A. and Mastrangelo, C.M. (1996). "Monitoring serially-dependent process with attributes data," Journal of Quality Technology, 28(3), 279-288.
    • (1996) Journal of Quality Technology , vol.28 , Issue.3 , pp. 279-288
    • Stimson, W.A.1    Mastrangelo, C.M.2
  • 17
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    • Limit theorems for the number of occurrences of consecutive k successes in n Markovian trials
    • Wang, Y.H. and Ji, S. (1995). "Limit theorems for the number of occurrences of consecutive k successes in n Markovian trials," Journal of Applied Probability, 32, 727-735.
    • (1995) Journal of Applied Probability , vol.32 , pp. 727-735
    • Wang, Y.H.1    Ji, S.2
  • 18
    • 84952149041 scopus 로고
    • Run length distributions of special cause control charts for correlated processes
    • Wardell, D.G., Moskowitz, H. and Plante, R.D. (1994). "Run length distributions of special cause control charts for correlated processes," Technometrics, 36, 3-22.
    • (1994) Technometrics , vol.36 , pp. 3-22
    • Wardell, D.G.1    Moskowitz, H.2    Plante, R.D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.