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Volumn 140, Issue 3-4, 1997, Pages 243-262
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Determination of low levels of transmutation-induced silicon in an aluminium reactor component using X-Ray energy dispersive spectrometry
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Author keywords
Neutron irradiation: Silicon, Aluminium; SEM; TEM; XEDS
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Indexed keywords
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EID: 0347650478
PISSN: 10420150
EISSN: None
Source Type: Journal
DOI: 10.1080/10420159708216850 Document Type: Article |
Times cited : (4)
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References (13)
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