El análisis elemental de las superficies de los sólidos mediante las espectroscopias Auger y de fotoelectrones de rayos X

Revista Mexicana de Fisica

Volumn 44, Issue 1, 1998, Pages 9-23

  Bartolo Perez P ^a,b   Pena J L ^a   Farias M H ^c  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

^b CENTRO DE INVESTIGACIÓN CIENTÍFICA Y DE EDUCACIÓN SUPERIOR DE ENSENADA   (Mexico)

^c UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

AES and XPS spectrocopies; Composition and phase identification

Indexed keywords

EID: 0347625348     PISSN: 0035001X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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