Determination of Fe, Al, Ca in Silicon Metal by XRF Spectrometry

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis

Volumn 21, Issue 4, 2001, Pages 571-

  Gu, Songhai ^a   Li, Xuhui ^a  

^a Tianjin Entry Exit Inspection Q   (China)

Author keywords

Silicon metal; XRF spectrometry

Indexed keywords

EID: 0347608214     PISSN: 10000593     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

1. Shanghua LIU. Chinese J. of Spectoscopy Laboratory, 1998, 15(6), 9
2. Shangnian TIE., 1997, 5: 51
3. Shangnian TIE., 1997, 5: 33
4. Ralph H Obenauf. Handbook of Sample Preparation and Handling, USA: SPEX Sample Preparation, 1994, 67