Classification of surface roughness and distance measurement using artificial neural network

Instrumentation Science and Technology

Volumn 31, Issue 4, 2003, Pages 417-423

  Neelamegam, P ^a   Rajendran, A ^b  

^a A V V M SRI PUSHPAM COLLEGE   (India)

^b NEHRU MEMORIAL COLLEGE   (India)

Author keywords

Artificial neural network; Back propagation algorithm; Distance measurement; Microcontroller; Surface classification; Surface roughness

Indexed keywords

BACKPROPAGATION; DATA PROCESSING; DIODES; DISTANCE MEASUREMENT; INFRARED DETECTORS; LEARNING ALGORITHMS; LEARNING SYSTEMS; NEURAL NETWORKS; SURFACE ROUGHNESS;

BACK PROPAGATION ALGORITHM; SURFACE CLASSIFICATION;

MICROCONTROLLERS;

EID: 0347603905     PISSN: 10739149     EISSN: None     Source Type: Journal    
DOI: 10.1081/CI-120025576     Document Type: Article

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