Characterization of SbSI nanocrystals by electron microscopy, X-ray diffraction and Raman scattering

Journal of Optoelectronics and Advanced Materials

Volumn 5, Issue 3, 2003, Pages 713-718

  Voynarovych, I M ^a   Gomonnai, A V ^b   Solomon, A M ^b   Azhniuk, Yu M ^b   Kikineshi, A A ^a   Pinzenik, V P ^a   Kis Varga, M ^c   Daroczy, L ^d   Lopushansky, V V ^b  

^a UZHGOROD NATIONAL UNIVERSITY   (Ukraine)

^b INSTITUTE OF ELECTRON PHYSICS   (Ukraine)

^c INSTITUTE OF NUCLEAR RESEARCH ATOMKI   (Hungary)

^d UNIVERSITY OF DEBRECEN   (Hungary)

Author keywords

Nanocrystals; Raman spectroscopy; Transmission electron microscopy; X ray diffraction

Indexed keywords

ANNEALING; ANTIMONY COMPOUNDS; BALL MILLING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; GRAIN SIZE AND SHAPE; PHONONS; RAMAN SCATTERING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CHEMICAL TRANSPORT; SURFACE PHONONS;

NANOSTRUCTURED MATERIALS;

EID: 0347595127     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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