Self-normalized photothermal technique for accurate thermal diffusivity measurements in thin metal layers

Review of Scientific Instruments

Volumn 74, Issue 12, 2003, Pages 5219-5225

  Balderas Lopez J A ^a,b   Mandelis, A ^a  

^a UNIVERSITY OF TORONTO   (Canada)

^b INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; FREQUENCY MODULATION; GEOMETRICAL OPTICS; INFRARED DETECTORS; LIGHT ABSORPTION; PHASE MEASUREMENT; PHOTOACOUSTIC EFFECT; RADIOMETRY; SIGNAL TO NOISE RATIO; SPECTROPHOTOMETRY; STEEL ANALYSIS; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL EXPANSION; THERMOELASTICITY; THIN FILM DEVICES; TRANSFER FUNCTIONS;

PHOTOTHERMAL (PT) MEASUREMENTS;

THERMAL DIFFUSION IN SOLIDS;

EID: 0347567164     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1623626     Document Type: Article

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