X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface

Langmuir

Volumn 19, Issue 26, 2003, Pages 10997-10999

  Kubowicz, Stephan ^a   Thünemann, Andreas F ^b,c   Geue, Thomas M ^d   Pietsch, Ullrich ^d   Watson, Mark D ^e   Tchebotareva, Natalia ^e   Müllen, Klaus ^e  

^a MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^c FRAUNHOFER INSTITUTE FOR APPLIED POLYMER RESEARCH   (Germany)

^d UNIVERSITY OF POTSDAM   (Germany)

^e MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CHARGE CARRIERS; COMPLEXATION; CRYSTAL STRUCTURE; MOLECULAR STRUCTURE; MULTILAYERS; SILICON WAFERS; SURFACE PHENOMENA; SURFACE STRUCTURE; X RAY ANALYSIS;

AMPHIPHILIC HEXE-PERI-HEXABENZOCORONENE; CRYSTALLINITY; LANGMUIR-BLODGETT MULTILAYERS; X RAY REFLECTIVITY;

AROMATIC COMPOUNDS;

EID: 0347567031     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la035210e     Document Type: Article

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