Two 9-alkylthiophenanthrenes at 193 K (alkyl = dodecyl and tetradecyl)

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 56, Issue 1, 2000, Pages 69-71

  Kansikas, Jarno ^a   Sipilä, Kaija ^a  

^a UNIVERSITY OF HELSINKI   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347563486     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270199012871     Document Type: Article

References (7)

1. Enraf-Nonius (1994). CAD-4 EXPRESS Software. Delft, The Netherlands.
2. Farrugia, L. J. (1998). WinGX. A Windows Program for Crystal Structure Analysis. University of Glasgow, Scotland.
3. Kansikas, J. & Sipilä, K. (1997). Acta Cryst. C53, 1127-1131.
4. Sheldrick, G. M. (1990). SHELXTLIPC User's Manual. Release 4.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
5. Sheldrick, G. M. (1993). SHELXL93. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
6. Sipilä, K. & Hase, T. (1997). Synth. Commun. 27, 1391-1393.
7. Sipilä, K., Kansikas, J. & Mesilaakso, M. (1999). J. Chem. Soc. Perkin Trans. 2, pp. 1841-1846.