High resolution x-ray tomography in an electron microprobe

Review of Scientific Instruments

Volumn 67, Issue 6, 1996, Pages 2251-2256

  Ferreira De Paiva, Rogério ^a,b   Bisiaux, Michel ^a   Lynch, John ^a   Rosenberg, Elisabeth ^a  

^a IFP ENERGIES NOUVELLES   (France)

^b UNIVERSIDADE ESTADUAL DO NORTE FLUMINENSE DARCY RIBEIRO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347549169     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147043     Document Type: Article

References (15)

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