Geometric linear discriminant analysis for pattern recognition

Pattern Recognition

Volumn 37, Issue 3, 2004, Pages 421-428

  Ordowski, Mark ^a   Meyer, Gerard G L ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

Bayes classifier; Bhattacharyya bound; Dimensionality reduction; Linear discriminant analysis; Linear transformation; Statistical pattern recognition; Symmetric divergence

Indexed keywords

GEOMETRY; MATHEMATICAL TRANSFORMATIONS;

GEOMETRIC LINEAR DISCRIMINANT ANALYSIS;

PATTERN RECOGNITION;

DISCRIMINANT ANALYSIS; IMAGE CLASSIFICATION; PATTERN RECOGNITION;

EID: 0347478108     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2003.07.002     Document Type: Article

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