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Volumn 3, Issue 2, 1997, Pages 113-120
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Utilising precursor ion and second-generation product ion scanning techniques in a four-sector mass spectrometer for the analysis of polymer additives
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Author keywords
Magnetic sector; Mass spectrometry; Polymer additive(s); Polymer(s); Precursor ion scanning; Second generation product ion scanning (MS3); Tandem mass spectrometry
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Indexed keywords
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EID: 0347468513
PISSN: 14690667
EISSN: None
Source Type: Journal
DOI: 10.1255/ejms.29 Document Type: Article |
Times cited : (8)
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References (16)
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