Modification of a research-grade FT-IR spectrometer for optional step-scan operation

Applied Spectroscopy

Volumn 47, Issue 9, 1993, Pages 1311-1316

  Gregoriou, Vasilis G ^a   Daun, Michael ^b   Schauer, Mark W ^a   Chao, James L ^a   Palmer, Richard A ^a  

^a DUKE UNIVERSITY   (United States)

^b Nicolet Instruments   (United States)

Author keywords

Depth profiling; FT IR spectroscopy; Photoacoustic FT IR spectroscopy; Step scan interferometry

Indexed keywords

FTIR SPECTROSCOPY; LIMIT OF DETECTION; MODULATION FREQUENCIES; PEAK-TO-PEAK;

DEPTH PROFILING; INFRARED SPECTROMETERS; INSTRUMENTS; PHASE MODULATION; PHOTOACOUSTIC SPECTROSCOPY;

SPECTROMETERS;

EID: 0347461730     PISSN: 00037028     EISSN: 19433530     Source Type: Journal    
DOI: 10.1366/0003702934067649     Document Type: Article

References (0)