Bayesian target location in images

Optical Engineering

Volumn 36, Issue 10, 1997, Pages 2649-2659

  Laude, Vincent ^a,b,c   Formont, Stephane ^a,d  

^a THALES   (France)

^b INSTITUT D'OPTIQUE GRADUATE SCHOOL   (France)

^c UNIVERSITÉ PARIS SACLAY   (France)

^d Fundamental Electronics Institute   (France)

Author keywords

Bayesian parameter estimation; Correlation filters; Correlation pattern recognition; Parameter estimation; Target location

Indexed keywords

EID: 0347409886     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601315     Document Type: Article

References (19)

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