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Volumn , Issue , 1996, Pages 453-460

A Si-Ge HBT technology for the wireless marketplace

Author keywords

[No Author keywords available]

Indexed keywords

HBT TECHNOLOGY;

EID: 0347398757     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (16)
  • 1
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  • 2
    • 0009906441 scopus 로고
    • Analytical modeling of current gain - Early voltage products in Si/SiGe
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  • 3
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    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 525
    • Cressler, J.D.1
  • 4
    • 4243315340 scopus 로고
    • Optimization of SiGe HBT technology for high speed analog and mixed-signal applications
    • D. L. Harame, et al, 'Optimization of SiGe HBT Technology for High Speed Analog and Mixed-Signal Applications', IEDM Tech. Dig., 874, 1993.
    • (1993) IEDM Tech. Dig. , pp. 874
    • Harame, D.L.1
  • 5
    • 0005320491 scopus 로고
    • Silicon germanium base heterojunction bipolar transistors by molecular beam epitaxy
    • S. S. Iyer, et al., 'Silicon Germanium Base Heterojunction Bipolar Transistors by Molecular Beam Epitaxy', Appl. Phys. Lett, 52,486,1988.
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    • Iyer, S.S.1
  • 6
    • 0024611641 scopus 로고
    • Si/SWGex heterojunction bipolar transistors produced by limited reaction processing
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    • King, C.A.1
  • 7
    • 84954135980 scopus 로고
    • Characterization of devices fabricated in films at low temperature by atmospheric pressure CVD
    • T. O. Sedgwick, et al, 'Characterization of Devices Fabricated in Films at Low Temperature by Atmospheric Pressure CVD', IEDM Tech. Dig., 451, 1991.
    • (1991) IEDM Tech. Dig. , pp. 451
    • Sedgwick, T.O.1
  • 8
    • 5844399719 scopus 로고
    • Low-temperature silicon epitaxy by ultra-high vacuum/chemical vapor deposition
    • B. S. Meyerson, Appl. Phys. Lett., 'Low-Temperature Silicon Epitaxy by Ultra-High Vacuum/Chemical Vapor Deposition',48, 797, 1986.
    • (1986) Appl. Phys. Lett. , vol.48 , pp. 797
    • Meyerson, B.S.1
  • 9
    • 18544395232 scopus 로고
    • A 200mm SiGe-HBT technology for wireless and mixed signal applications
    • D. L. Harame, et al., IEDM Tech. Dig., 'A 200mm SiGe-HBT Technology for Wireless and Mixed Signal Applications', 437,1994.
    • (1994) IEDM Tech. Dig. , pp. 437
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  • 10
    • 0030086653 scopus 로고    scopus 로고
    • Si/SiGe HBT technology for low-cost monolithic microwave integrated circuits
    • L. Larson, et al, 'Si/SiGe HBT Technology for Low-Cost Monolithic Microwave Integrated Circuits', ISSCC Dig. of Tech. Papers, 80, 1996.
    • (1996) ISSCC Dig. of Tech. Papers , pp. 80
    • Larson, L.1
  • 11
    • 0029532543 scopus 로고
    • A 200 mm SiGe-HBT BiCMOS technology for mixed signal applications
    • D. Nguen-Ngoc, et al, 'A 200 mm SiGe-HBT BiCMOS Technology for Mixed Signal Applications', BCTM Proceedings, 89, 1995.
    • (1995) BCTM Proceedings , pp. 89
    • Nguen-Ngoc, D.1
  • 12
    • 0029536454 scopus 로고
    • SiGe HBT technology: Device and application issues
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  • 13
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    • Sub-30ps ECL circuits using high-ft si and sige epitaxial base SEEW transistors
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    • (1993) IEDM Tech. Dig. , pp. 83
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  • 14
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    • RF analog and digital circuits in SiGe technology
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  • 15
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    • A 23 GHz static 1/128 frequency divider implemented in a manufacturable SiGe epitaxial base heterojunction bipolar technology
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    • (1995) BCTM Proceedings , pp. 121
    • Case, M.1
  • 16
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    • A 5-GHz SiGe HBT return-to-zero comparator
    • W. Gao, et al., 'A 5-GHz SiGe HBT Return-to-Zero Comparator', BCTM Proceedings, 166, 1995.
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    • Gao, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.