Schlieren technique to in situ monitor rapidly-growing KDP crystal surface

Journal of Crystal Growth

Volumn 219, Issue 1-2, 2000, Pages 83-90

  Bredikhin, V I ^a   Galushkina, G L ^a   Kuznetsov, S P ^a  

^a INSTITUTE OF APPLIED PHYSICS   (Russian Federation)

Author keywords

Investigation in situ; KDP crystal; Rapid profiling growth; Schlieren method; Surface morphology

Indexed keywords

EID: 0347315941     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00603-5     Document Type: Article

References (12)

1. L.N. Rashkovich, G.T. Moldazhanova, Kristallografiya 39 (1994) 135.
2. I.V. Alekseev, A.A. Chernov, Kristallografiya 41 (1996) 348.
3. James De Yoreo, Terry Land, The Secrets of Crystal Growth (1997), LLNL Electronic Library, http://www.llnl.gov/str/DeYoreo.html.
4. S.A. De Vries, E. Vlieg, P. Goedkindt, W.J. Huisman, M.J. Zwanenburg, S.L. Bennet, J.J. De Yoreo, The 12th International Conference on Crystal Growth, Jerusalem, Israel, 1998, Abstracts, p. 143.
5. C. Orme, S. Orme, H.H. Teng, P.M. Dove, J.J. De Yoreo, The 12th International Conference on Crystal Growth, Jerusalem, Israel, 1998, Abstracts, p. 147.
6. M.T. McBrige, T.A. Land, J.J. De Yoreo, G.T.R. Palmore, The 12th International Conference on Crystal Growth, Jerusalem, Israel, 1998, Abstracts, p. 296.
7. T.L. Martin, T.A. Land, G.T.R. Palmore, J.J. De Yoreo, The 12th International Conference on Crystal Growth, Jerusalem, Israel, 1998, Abstracts, p. 357.
8. V.I. Bredikhin, G.L. Galushkina, S.P. Kuznetsov, The 12th International Conference on Crystal Growth, Jerusalem, Israel, 1998, Abstracts, p. 143.
9. A.A. Chernov, L.N. Rashrovich, A.A. Mkrtchan, J. Crystal Growth 74 (1986) 101.
10. V.I. Bredikhin, V.E. Bystrov, V.P. Ershov, L.A. Lavrov, V.I. Katsman, Patent RF No. 1342056, priority 1985.
11. V.P. Ershov, V.I. Katsman, Patent RF No. 955741, priority 1980.
12. V.I. Bespalov, V.I. Bredikhin, V.P. Ershov, V.I. Katsman, L.A. Lavrov, J. Crystal Growth 82 (1987) 776.