SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 308-309, Issue 1-4, 1997, Pages 611-614

Electrical and mechanical properties of MgO thin films on GaAs

(3) Soto, R a Mergui, S a Schmidt, P E a

a Florida International University (United States)

Author keywords

Electronic properties; GaAs; MgO films

Indexed keywords

CAPACITANCE MEASUREMENT; CRYSTALLINE MATERIALS; ELECTRIC PROPERTIES; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; MAGNESIA; MAGNETRON SPUTTERING; RESIDUAL STRESSES; SEMICONDUCTING GALLIUM ARSENIDE; THERMAL EFFECTS; VOLTAGE MEASUREMENT; YTTRIUM COMPOUNDS;

ROOM TEMPERATURE RESISTIVITY;

THIN FILMS;

EID: 0347307229 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00434-3 Document Type: Article

Times cited : (9)

References (15)

1
- 0348085057
- New Orleans, LA
- Y. Vlasov, R. Soto, J. Rodriguez, S. Mergui, Y. Darici, G.L. Larkins, Jr. and R.J. Kennedy, IEEE Intermag Conf., New Orleans, LA, 1977.
- (1977) IEEE Intermag Conf.
- Vlasov, Y.¹ Soto, R.² Rodriguez, J.³ Mergui, S.⁴ Darici, Y.⁵ Larkins G.L., Jr.⁶ Kennedy, R.J.⁷

2
- 0348085055
- Temperature studies of sulfur passivated GaAs(100) contacts
- D. Wu, L. Liu, Y. Darici, N. Paul and S. Mergui, Temperature studies of sulfur passivated GaAs(100) contacts, Mater. Sci. Eng. B, 1996.
- (1996) Mater. Sci. Eng. B
- Wu, D.¹ Liu, L.² Darici, Y.³ Paul, N.⁴ Mergui, S.⁵

3
- 21544454724
- W.-Y. Hsu and R. Raj, Appl. Phys. Lett., 60 (1992) 3105.
- (1992) Appl. Phys. Lett. , vol.60 , pp. 3105
- Hsu, W.-Y.¹ Raj, R.²

4
- 21544465645
- M. R_hle
- J. Bruley, S. Stemmer, F. Ernst, M. R_hle, W.-Y. Hsu and R. Raj, Appl. Phys. Lett., 65 (1994) 564.
- (1994) Appl. Phys. Lett. , vol.65 , pp. 564
- Bruley, J.¹ Stemmer, S.² Ernst, F.³ Hsu, W.-Y.⁴ Raj, R.⁵

5
- 0348085054
- E.J. Tarsa, X.H. Wu, J.P. Ibbetson, J.S. Speck and J.J. Zinck, Appl. Phys. Lett., 66 (1995) 3590.
- (1995) Appl. Phys. Lett. , vol.66 , pp. 3590
- Tarsa, E.J.¹ Wu, X.H.² Ibbetson, J.P.³ Speck, J.S.⁴ Zinck, J.J.⁵

6
- 36449001104
- L.S. Hung, L.R. Zheng and T.N. Blanton, Appl. Phys. Lett., 60 (1992) 3129.
- (1992) Appl. Phys. Lett. , vol.60 , pp. 3129
- Hung, L.S.¹ Zheng, L.R.² Blanton, T.N.³

7
- 0030230482
- Y. Hakuraku, K. Maezono and H. Ueda, Supercond. Sci. Technol., 9 (1996) 775.
- (1996) Supercond. Sci. Technol. , vol.9 , pp. 775
- Hakuraku, Y.¹ Maezono, K.² Ueda, H.³

8
- 36449006946
- L.D. Chang, M.Z. Tseng, E.L. Hu and D.K. Fork, Appl. Phys. Lett., 60 (1992) 1753.
- (1992) Appl. Phys. Lett. , vol.60 , pp. 1753
- Chang, L.D.¹ Tseng, M.Z.² Hu, E.L.³ Fork, D.K.⁴

9
- 0348085051
- M.Z. Tseng, C. Nguyen, E. Tarsa, L.D. Chang, E.L. Hu and H. Kroemer, Appl. Phys. Lett., 61 (1992) 602.
- (1992) Appl. Phys. Lett. , vol.61 , pp. 602
- Tseng, M.Z.¹ Nguyen, C.² Tarsa, E.³ Chang, L.D.⁴ Hu, E.L.⁵ Kroemer, H.⁶

10
- 0026989820
- O. Eibl, W. Prasseit, B. Utz, S. Corsepius, P. Berberich and H. Kinder, Physica, C 203 (1992) 445.
- (1992) Physica, C , vol.203 , pp. 445
- Eibl, O.¹ Prasseit, W.² Utz, B.³ Corsepius, S.⁴ Berberich, P.⁵ Kinder, H.⁶

11
- 0001359681
- K. Nashimoto, D.K. Fork and T.H. Geballe, Appl. Phys. Lett., 60 (1992) 1199.
- (1992) Appl. Phys. Lett. , vol.60 , pp. 1199
- Nashimoto, K.¹ Fork, D.K.² Geballe, T.H.³

12
- 0028459557
- A. Masauda and K. Nashimoto, Jap. J. Appl. Phys., 33 (1994) 793.
- (1994) Jap. J. Appl. Phys. , vol.33 , pp. 793
- Masauda, A.¹ Nashimoto, K.²

13
- 0348085049
- D.K. Fork, F.A. Ponce, J.C. Tramontana and T.H. Geballe, Appl. Phys. Lett., 58 (1991) 2295.
- (1991) Appl. Phys. Lett. , vol.58 , pp. 2295
- Fork, D.K.¹ Ponce, F.A.² Tramontana, J.C.³ Geballe, T.H.⁴

14
- 0040870462
- M. De Graef and D.R. Clark, Appl. Phys. Lett., 63 (1993) 1044.
- (1993) Appl. Phys. Lett. , vol.63 , pp. 1044
- De Graef, M.¹ Clark, D.R.²

15
- 0346824286
- University of Florida
- D.J. Kang in Stress measurement in aluminum based thin film metallization ICs, University of Florida, 1991.
- (1991) Stress Measurement in Aluminum Based Thin Film Metallization ICs
- Kang, D.J.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.