Temperature-induced changes in polyelectrolyte films at the solid-liquid interface

Applied Physics A: Materials Science and Processing

Volumn 74, Issue SUPPL.I, 2002, Pages

  Steitz, R ^a,b   Leiner, V ^c   Tauer, K ^d   Khrenov, V ^d   Klitzing, R V ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c INSTITUT LAUE LANGEVIN   (France)

^d MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BLOCK COPOLYMERS; DEPOSITION; NEUTRON REFLECTION; PHASE INTERFACES; POLYELECTROLYTES; SILICON; SOLUTIONS; THERMAL EFFECTS; THICKNESS MEASUREMENT;

LAYER BY LAYER DEPOSITION; NEUTRON REFLECTOMETRY; POLYELECTROLYTE FILMS; STRUCTURAL CHANGES; TEMPERATURE INDUCED CHANGES; THERMOSENSITIVE FILMS;

PLASTIC FILMS;

EID: 0347297390     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390201782     Document Type: Article

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