Optimized BIST strategies for programmable data paths based on cellular automata

Proceedings - International Test Conference

Volumn 1992-January, Issue , 1992, Pages 110-119

  Vansas, J ^a,b   Catthoor, F ^a   Deman, H ^a  

^a IMEC   (Belgium)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

Automata; Automatic testing; Built in self test; Circuit faults; Fault detection; Laboratories; Optimization methods; Read only memory; Telephony; Test pattern generators

Indexed keywords

AUTOMATIC TESTING; CELLULAR AUTOMATA; FAULT DETECTION; LABORATORIES; RECONFIGURABLE HARDWARE; ROM; SPEECH PROCESSING;

AUTOMATA; CIRCUIT FAULTS; OPTIMIZATION METHOD; TELEPHONY; TEST PATTERN GENERATOR;

BUILT-IN SELF TEST;

EID: 0347250157     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1992.527811     Document Type: Conference Paper

References (0)