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Volumn 25, Issue 5, 1996, Pages 793-797

MBE growth and properties of GaN and AlxGa1-xN on GaN/SiC substrates

Author keywords

AlxGa1 xN; GaN; GaN SiC substrates; Molecular beam epitaxy; Transmission electron microscopy

Indexed keywords


EID: 0347221720     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02666638     Document Type: Article
Times cited : (12)

References (17)
  • 13
    • 21544444614 scopus 로고
    • An exception to this point is the work of R.J. Molnar and T.D. Moustakas who modified a commercial MBE system for both optical emission spectroscopy and Langmuire probe studies of nitrogen plasmas generated by an ECR plasma source. See R.J. Molnar and T.D. Moustakas, J. Appl. Phys. 76, 4587 (1994).
    • (1994) J. Appl. Phys. , vol.76 , pp. 4587
    • Molnar, R.J.1    Moustakas, T.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.