Sample charge compensation via self-charge-stabilizing ion optics

International Journal of Mass Spectrometry

Volumn 178, Issue 3, 1998, Pages 187-204

  Dahl, David A ^a   Appelhans, Anthony D ^a  

^a IDAHO NATIONAL LABORATORY   (United States)

Author keywords

Ion optics; Ion trap; Sample charging; Secondary ion mass spectrometry

Indexed keywords

EID: 0347177239     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1387-3806(98)14120-9     Document Type: Article

References (14)

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