Study of an Optical Device Used to Homogenize a Laser Beam. Application to Emissivity Measurements on Semitransparent Materials at High Temperature

International Journal of Thermophysics

Volumn 24, Issue 5, 2003, Pages 1427-1439

  Delmas, A ^a   Li, J C ^b  

^a UNIVERSITÉ DE LYON   (France)

^b KUNMING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Diffraction; Emissivity; Fourier optics; Homogenization; Interference; Semi transparent materials

Indexed keywords

CARBON DIOXIDE; CHEMICAL ANALYSIS; COMPUTER SIMULATION; ENERGY TRANSFER; FOURIER OPTICS; HIGH TEMPERATURE EFFECTS; LASER BEAMS; LIGHT EMISSION;

HOMOGENIZATION; SEMI-TRANSPARENT MATERIALS;

OPTICAL DEVICES;

EID: 0347132571     PISSN: 0195928X     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1026171706211     Document Type: Article

References (9)

1. Y. Kawamura, Y. Itagaki, K. Toyoda, and S. Namba, Optics Comm. 48:44 (1983).
2. D. M. Dangenais, J. A. Woodroffe, and I. Itzkan, Appl. Optics 24:67 (1985).
3. J. C. Li, J. Merlin, and J. Perez, Rev. de Phys. Appl. 21:425 (1986).
4. G. Herziger and E. W. Kreutz, SPIE 1024:2 (1988).
5. J. C. Li, R. Lopes, Ch. Vialle, and J. F. Sacadura, J. Laser Appl. 1:279 (1999).
6. R. Lopes, A. Delmas, and J. F. Sacadura, High Temp.-High Press. 32:369 (2000).
7. J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, New York, 1968).
8. J. C. Li, C. Vialle, and J. Merlin, J. Opt. 24:41 (1993).
9. J. C. Li and J. Merlin, J. Phys. III 1:331 (1991).