Reliability optimization of complex systems using modified random-to-pattern search (MRPS) algorithm

Quality and Reliability Engineering International

Volumn 15, Issue 3, 1999, Pages 239-243

  Murty, B S N ^a   Reddy, P J ^a  

^a INDIAN INSTITUTE OF CHEMICAL TECHNOLOGY   (India)

Author keywords

Global optimum; Pattern search; Random numbers; System reliability

Indexed keywords

EID: 0347128791     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1099-1638(199905/06)15:3<239::aid-qre242>3.0.co;2-d     Document Type: Article

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