High-resolution X-ray diffraction analysis of SnTe/Sn1-xEu xTe superlattices grown on (1 1 1) BaF2 substrates

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 20, Issue 3-4, 2004, Pages 462-465

  Abramof, E ^a   Rappl, P H O ^a   Ueta, A Y ^a  

^a INSTITUTO NACIONAL DE PESQUISAS ESPACIAIS   (Brazil)

Author keywords

IV VI compounds; Molecular beam epitaxy; Superlattices; X ray diffraction

Indexed keywords

BARIUM COMPOUNDS; COMPUTER SIMULATION; CRYSTAL LATTICES; DIFFRACTOMETERS; MOLECULAR BEAM EPITAXY; MOLECULAR STRUCTURE; SEMICONDUCTOR GROWTH; SEMICONDUCTOR SUPERLATTICES; X RAY DIFFRACTION ANALYSIS;

BEAM EQUIVALENT PRESSURE (BEP); BRAGG DIFFRACTION; BUFFER LAYERS;

SEMICONDUCTING TIN COMPOUNDS;

EID: 0347128573     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2003.08.058     Document Type: Conference Paper

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